Advantest Introduces Highly Accurate 2Gbps Test Solution for Source- Synchronous Bi-Directional Interfaces; Broadens Range of So
2007年10月23日 - 4:38AM
PRニュース・ワイアー (英語)
36-Channels, Zero Round Trip, and New Multi-Strobe Technology
Provide Fast, Accurate Testing of DDR2/DDR3 Interfaces with
Excellent ROI SANTA CLARA, Calif., Oct. 22 /PRNewswire-FirstCall/
-- Advantest Corporation (TSE:6857TSE:NYSE:TSE:ATE) today is
announcing its new 2Gbps source synchronous(1) interface test
solution, which offers high-accuracy testing for source-synchronous
interfaces such as DDR2/DDR3 which are found in most CPUs and
memory chipsets. Advantest's new 2Gbps Digital Module (2GDM) test
solution, a complete functional/AC/DC test solution for the
company's T2000 open-architecture test system, features very high
performance at low cost. The high-density test module provides a
total of 36 Input/Output (I/O) channels, each with digital drive,
digital compare, and an additional FlyBy(2) compare channel, along
with DC and frequency measurement capabilities. Its unique edge
shift and patented Advantest multi-strobe capabilities
significantly speed timing margin testing providing for single pass
testing of most source-synchronous and timing parameters. The new
module addresses the industry's need for an SoC tester that can
perform high-throughput at-speed functional test on source-
synchronous interfaces. Meets Changing Market and Technology Needs
Growing market demand for multimedia (video, music, online games)
personal computers means that CPU and memory data processing
capacity of semiconductors must also become more advanced.
Particularly in the memory field, because of Microsoft's recently
introduced Windows Vista(R), a shift is expected from DDR2 to DDR3,
the latest generation offering fast processing speeds and larger
capacity. This technology requires source-synchronous interfaces,
which enable high-speed data transfer between the CPU and memory
devices. Testing these interfaces on traditional SoC test systems
carries significant added test costs, because without the FlyBy
comparators available on the 2GDM, two tester channels are required
per DUT pin. Additionally, confirming the timing margins on these
source-synchronous interfaces requires that the tester
pin-electronics track the DUT output clock and perform timing
measurements relative to its timing. The 2GDM is unique in the
industry as it performs this task within a single test pass, using
patented Advantest technology. New Product Meets New Needs for
Performance, As Well As For Cost The new 2GDM enables full
functional testing of high-speed source- synchronous interfaces up
to a speed of 2Gbps on the T2000 OPENSTAR(R) standard-based test
platform, with high accuracy, low cost and overall reliability that
sets a new level of performance. Features and Benefits * The
industry's first testing solution to support source-synchronous
testing with the use of multi-strobe technology. Advantest's
patented multi-strobe, which enables real-time testing of
high-speed source- synchronous interfaces, dramatically simplifies
test setup and reduces device test time. * The 2GDM supports test
speeds up to 2Gbps to keep pace with high-speed data transfer
requirements for DDR2/DDR3 interface testing. * Each of the 36
channels on the 2GDM provides a secondary compare channel which
allows the module to test bi-directional I/O busses with a zero
round-trip delay. This effectively nullifies the impact of the
signal delays through the interconnect and performance board. An
integrated zero round-trip solution provides the user a simpler
test setup environment as well as much lower cost. * It expands the
range of tests that can be performed on a single SoC test system,
Advantest's T2000, extending and enhancing ROI. The 2Gbps not only
enables real-time testing of high-speed source-synchronous
interfaces on an SoC test system, but it expands the capabilities
of the T2000 non-proprietary test platform. The new module is part
of a suite of SoC test solutions for Advantest's T2000, which also
includes higher speeds (up to 6.5Gbps), higher density (up to 128
cost effective channels per module), higher power, mixed signal,
and RF testing capabilities (see 12GWSGA RF module release dated
10/28/07). The 2GDM adds cost effective testing of bi-directional
source-synchronous interfaces to the offerings. Advantest's 2Gbps
Digital Module will be available in January, 2008. Pricing provided
on request. About Advantest Advantest Corporation is the world's
leading automatic test equipment supplier to the semiconductor
industry, and also produces electronic and optoelectronic
instruments and systems. A global company, Advantest has long
offered total ATE solutions and serves the industry in every
component of semiconductor test: tester, handler, mechanical and
electrical interfaces, and software. Its logic, memory,
mixed-signal and RF testers, and device handlers are integrated
into the most advanced semiconductor production lines in the world.
Founded in Tokyo in 1954, Advantest established its first
subsidiary in 1982 in the U.S.A. and now has 43 subsidiaries
worldwide. Among them Advantest America, Inc. is based in Santa
Clara, California and Advantest (Europe) GmbH is based in Munich,
Germany. More information is available at
http://www.advantest.com/. (1) The device transmitting data also
constantly outputs the standard clock signals simultaneously,
thereby achieving highly accurate timing of data reception. (2)
FlyBy is a registered trademark of Advantest Corporation in the
United States, Japan and other countries. OPENSTAR is a registered
trademark of the Semiconductor Test Consortium, Inc. in the United
States, Japan and other countries. Windows and Windows Vista are
registered trademarks or trademarks of Microsoft Corporation in the
United States and other countries. DATASOURCE: Advantest
Corporation CONTACT: Amy Gold of Advantest America, Inc.,
+1-212-850-6670, ; or Barbara Palmer of Palmer Communications for
Advantest America, Inc., +1-914-725-8057, Web site:
http://www.advantest.com/
Copyright