Advantest Introduces High Performance, Fully Integrated SoC Test Cell Solution For Consumer Devices at Semicon West; Also Demons
2007年7月17日 - 11:33PM
PRニュース・ワイアー (英語)
Unsurpassed Parallelism, Ease of Use Meet Cost, Complexity
Challenges of Consumer IC Market While Setting New Performance
Standards SAN FRANCISCO, Calif., July 17 /PRNewswire-FirstCall/ --
Advantest Corporation (TSE:6857TSE:NYSE:TSE:ATE), the world's
leading supplier of semiconductor test equipment, is introducing a
new, high performance SoC test cell solution for manufacturers of
IC consumer devices at Semicon West, Booth 7347, July 17-19 at San
Francisco's Moscone Center. Advantest's integration of the handler
and interfacing along with the tester and software products into a
complete test cell offers the industry a new order of test solution
for consumer SoCs. The turn-key, highly parallel solution is
comprised of Advantest's new T2000 LS mainframe and new
high-density application modules along with its new M4841
state-of-the-art handler -- a complete test cell optimized for very
high performance targeted to price-sensitive makers of today's
complex consumer device ICs. For decades the established leader in
parallel test technology for the memory market, Advantest has now
applied its expertise to revolutionize test in the non-memory, SoC
market. In addition, Advantest has long designed and manufactured
its own handlers, as well as testers, and the company has developed
advanced handler technology that, together with its
state-of-the-art SoC test systems, contributes to significantly
lower cost of test. At Semicon, Advantest is showcasing its test
system, T2000 LS mainframe coupled with its M4841 Dynamic Test
Handler, providing a cutting-edge test solution for a range of
complex, highly integrated consumer devices. (See accompanying
release with details on test cell and demonstration.) With parallel
testing of sixteen high pincount devices and a throughput of 18,500
Units Per Hour (UPH), Advantest's new test cell offers the
industry's most cost-effective, high-volume digital consumer
solution available. R. Keith Lee, president and CEO of Advantest
America, says, "Our customers in the consumer device segment of the
industry need reliable, accurate high- volume testing for devices
that are very complex and very dense. Along with these
requirements, they need to lower test costs continually to keep
pace with the downward pricing pressures that characterize the
consumer products market. Advantest is able to meet customers'
needs by leveraging the strengths of our memory test product line
and applying handler solutions. Together they make for a single
vendor high-performance test cell that only Advantest can deliver.
Drawing on the company's diverse engineering and applications
resources, Advantest is able to cross-pollinate test technology and
solutions for the digital consumer market, providing proven,
elegantly simple state-of-the-art test capabilities." Software
Augments Test Versatility The two new applications modules being
demonstrated on this new test equipment are a very high density
800Mbps digital channel module and a 32- channel PMU module. The
800MDM digital pin electronics module houses 128 channels in a
single test head slot and is capable of up to 800Mbps for high
speed data busses such as DDR2. The 32-channel PMU module is useful
for general DC measurements as well as ADC/DAC testing, and
provides a low-cost solution ideal for testing analog inputs and
outputs on consumer devices. At Semicon, information will also be
available about Advantest's other applications modules for the
T2000 open architecture platform. In addition to this singular test
cell solution, Advantest is also demonstrating ATE-to-EDA linkage
tools that compress time-to-market. Advantest's EDA STIL software
tools include: -- Design and Test Data Viewer (DTV), which
eliminates the data format barriers between design and tester --
SCAN FF Map, which uses statistical methods to systematically
narrow down defects observed across multiple wafers quickly and
automatically -- Virtual Test Express, which integrates the device
simulator with the tester simulator for seamless device test debug
without silicon, dramatically reducing lead time from design to
volume manufacturing All of these new products are available now.
Advantest is also participating in two SEMI TechXPOT technology
sessions Gary Fleeman, Advantest America's director of memory
product engineering, will discuss "Critical Issues in Test" on
Tuesday at 3:20 p.m. R. Keith Lee, president and CEO of Advantest
America, will participate in the Executive Test Summit panel
discussion on Wednesday at 5:30 p.m. About Advantest Advantest
Corporation is the world's leading supplier of automatic test
equipment (ATE) to the semiconductor industry. Advantest's SoC,
logic, memory, mixed-signal and RF testers and device handlers are
integrated into the most advanced semiconductor fabrication lines
in the world. Founded in Tokyo in 1954, Advantest established its
North American subsidiary in 1982 and its European subsidiary in
1984. More information is available at http://www.advantest.com/.
DATASOURCE: Advantest Corporation CONTACT: Amy Gold of Advantest
America, Inc., +1-212-850-6670, or ; or Barbara Palmer of Palmer
Communications, +1-914-725-8057, or Web site:
http://www.advantest.com/
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