Advantest Introduces 3 New Cost-Efficient Options for T6577 SoC Test System
2006年12月2日 - 12:12AM
PRニュース・ワイアー (英語)
Low-Cost Test Solution Targets High-Functionality Consumer
Electronics Devices TOKYO, Dec. 1 /PRNewswire-FirstCall/ --
Advantest Corporation (TSE:6857TSE: NYSE:TSE:ATE), today announced
the availability of three new modules for its T6577 SoC test
platform that provide low-cost solutions to the diversifying test
requirements of high-functionality SoC device manufacturers. These
include a DDR2 Interface Test Option, a Base Band Waveform
Generator / Digitizer (BBWGD) Option, and a Sine Wave Generator
(SG) / Jitter Measurement Module (JMM) Option. Easily installed
within the test head of the T6577, these new options help to cut
costs otherwise incurred with complex test board manufacturing and
maintenance, and contribute to significant yield improvements, as
well. The T6577 will be exhibited at Semicon Japan, December 6 - 8,
at Chiba's Makuhari Messe. Competition is intensifying in the
consumer electronics market, where worldwide growth in demand for
popular products such as DVD players, portable televisions, and
cellular phones is predicted to continue. With manufacturers
striving to differentiate their offerings, makers of the devices
that drive these products have increasingly pushed the
technological envelope, competing not merely on price but on
functionality and versatility. Advances in integration techniques
now enable one chip to perform several different functions -- a
trend that is set to continue. During manufacturing, however, each
function performed by the SoC device must be tested separately and
to a high level of accuracy. This capability was formerly available
only on costly, high-performance test systems, whose price tags
presented a severe obstacle to manufacturers seeking to cut test
costs. Advantest's new low-cost test solution consists of options
designed for use with the T6577 SoC test system, launched by the
company in June 2004. Now, customers can utilize their existing
assets to conduct tests on highly complex, multi-functional
consumer electronics SoC devices, eliminating the need for
expensive new tester purchases. * DDR2 Interface Test Option
Supporting source synchronization techniques, this option enables
low- cost, at-speed test of memory interface functions and AC test.
Maximum write test speed: 667Mbps. * BBWGD (Base Band Waveform
Generator / Digitizer) Option This option adds baseband and analog
test capability within the 100MHz range of signals utilized by SoC
devices employed in cellular phones. A single module provides 16
channels of waveform generators and digitizers, increasing
parallelism and achieving an approximately 50% reduction in cost of
test over the previous model. * SG (Sine Wave Generator) / JMM
(Jitter Measurement Module) Option This option tests the high-speed
AD converters used in consumer electronics and other products with
the capacity to generate sine waves at speeds up to 500MHz. It also
supports jitter measurement of PLL (Phase Locked Loop) circuits and
high-speed devices, up to 500MHz. With 4 channels per module, the
sine wave generator and jitter measurement module help to cut test
cost by approximately 50% over previous Advantest models. All three
modules will be available for shipment from the start of December.
Prices begin at 3 million yen. About Advantest Advantest
Corporation is the global leader in automatic test equipment to the
semiconductor industry. Advantest's SoC, logic, memory,
mixed-signal and RF testers and device handlers are integrated into
the most advanced semiconductor fabrication lines in the world.
Founded in Tokyo in 1954, Advantest established its North American
subsidiary in 1982 and its European subsidiary in 1984. More
information is available at http://www.advantest.com/. Note: All
information supplied in this release is correct at the time of
publication. DATASOURCE: Advantest Corporation Japan CONTACT: Amy
Gold of Advantest America, Inc., +1-212-850-6670, Web site:
http://www.advantest.com/
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