Advantest Launches M4841 Dynamic Test Handler
2006年12月2日 - 12:02AM
PRニュース・ワイアー (英語)
High-throughput Device Handler for Volume Testing of MCUs and DSPs
TOKYO, Dec. 1 /PRNewswire-FirstCall/ -- Advantest Corporation
(TSE:6857TSE:NYSE:TSE:ATE), today announced that its new M4841
dynamic test handler, supporting packages including BGA, CSP, and
QFP, with a maximum parallel test capacity of 16 devices and a
throughput of 18,500 devices per hour, will debut at SEMICON Japan,
December 6-8, at Chiba's Makuhari Messe. The handler will be
available for shipment beginning April 2007. Today's semiconductors
are gaining in complexity both in circuit design and packaging, and
continue to be challenged by high-volume applications that function
in environments with wide-ranging temperatures. Semiconductor test
and handling equipment must evolve to meet these requirements, in
the same way it must adapt to increasing demands for higher
parallelism and higher throughput. Unique in its class, Advantest's
new M4841 Dynamic Test Handler enables high-throughput parallel
test for very high volumes of devices and supports complex ICs and
packages, including BGA, CSP and QFP. Because of its advanced
performance capabilities and features, the M4841 is the optimal
dynamic test handler for high volume production of devices used in
consumer applications such as portable digital equipment and
automotive systems. 16-Device Parallel Test Reduces Cost of Test
The M4841 is capable of parallel testing up to 16 devices, double
the capability of the earlier, industry-leading handler, also from
Advantest. The M4841 also delivers a high throughput of 18,500
devices per hour. With three times the throughput capacity of its
predecessor, the M4841 sets a new standard for the industry.
Because of its high test efficiency, the M4841 is well-suited for
high-volume production lines. With its unprecedented combination of
16-device parallel test and 18,500 device-per-hour throughput at 3
seconds test time or less, the M4841 makes a substantial
contribution to reduced cost of test. Additionally, it employs an
advanced temperature-stabilization method to cool devices to -40�C
or heat them to 125�C, allowing it to test devices that must meet
the highest standards, such as those used in automotive electronics
and avionics, under a range of extreme environmental stresses.
Inheriting Advantest's acclaimed Soft Touch Handling mechanism,
together with optimized interior motion controls, the M4841
provides a high-accuracy test environment. Customers can select the
optimal configuration for their needs, as the company offers a
range of parameters for parallel test capacity, temperature range,
and processing capacity. This reduces installation costs and
contributes to overall system optimization. Key Specifications
M4841 Dynamic Test Handler Target Packages: BGA, CSP, QFP, others
Parallel Test Capacity: maximum 16 devices Throughput: 18,500
devices / hour Temperature Range: -40�C ~ 125�C About Advantest
Advantest Corporation is the global leader in automatic test
equipment to the semiconductor industry. Advantest's SoC, logic,
memory, mixed-signal and RF testers and device handlers are
integrated into the most advanced semiconductor fabrication lines
in the world. Founded in Tokyo in 1954, Advantest established its
North American subsidiary in 1982 and its European subsidiary in
1984. More information is available at http://www.advantest.com/.
DATASOURCE: Advantest Corporation Japan CONTACT: Amy Gold,
Advantest America, Inc., +1-212-850-6670, Web site:
http://www.advantest.com/
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