Onto Innovation Advances Process Control Suite for 3D Interconnect Yields
2025年1月14日 - 9:35PM
ビジネスワイヤ(英語)
Announces orders for 3Di™ technology on
Dragonfly® G3 system and release of EchoScan™ void detection
system
Onto Innovation Inc. (NYSE: ONTO) today announced advances in
its product suite for 3D interconnect process control, featuring
the new 3Di™ technology on the Dragonfly® G3 system for bump
process control in high bandwidth memory (HBM) and advanced logic
applications. Additionally, the EchoScan™ system is introduced for
detecting voids as small as 1µm in wafer bonding applications, such
as advanced hybrid bonding for Cu-Cu interconnects. Initial orders
for the 3Di technology include a top HBM manufacturer, a tier one
OSAT and a leading manufacturer of bump process equipment. The
first EchoScan system will ship in the first quarter, with
additional tools planned to ship to customers throughout 2025.
Advanced packages with 2.5D and 3D integration schemes are
projected to grow at a rate of 19% from 2024 through 2028,
according to TechInsights. Interconnect bump heights in high volume
manufacturing (HVM) are decreasing from 12µm to 8µm, and
potentially to 4µm. As bump sizes decrease, metrology and
inspection become increasingly critical to ensuring high
yields.
“High-performance HBM and GPU devices powering AI packages
demand smaller line/space and bump pitch requirements,” says Mike
Rosa, Onto’s chief marketing officer and senior vice president of
strategy. “Onto designed the 3Di technology to meet customers’
needs for more stable technologies accommodating smaller bump
sizes—even below 5µm in HVM and 2µm in R&D—in next generation
logic and memory devices.”
Interconnect density intensifies with the adoption of hybrid
bonding for bond pad interconnects, with planar bump heights and
the challenge of inline micro void detection at the Cu-Cu bond pad
interface. Undetected voids can lead to wafer cracking and open
electrical connections, resulting in yield loss. Current
technologies are limited to ≥10µm void size sensitivity and require
water immersion, which adds the risk of bonded wafer contamination,
delamination and lack of void traceability for inline process
control.
“Onto’s EchoScan system offers die and wafer level, immersion
free, non-contact technology for voids down to 1µm in HVM. This
solution is being released to select customers to detect 1µm voids
in atmosphere at the same speed as incumbent technologies limited
to ~10µm,” Rosa continued. “Whether using micro bump or hybrid
bonding technologies, Onto Innovation provides the critical process
control solution. When paired with our Discover® analytical
software, both solutions enable real-time defect analysis and
feedback to process tools for statistical process control, reducing
the cycle time of yield loss assessment and helping customers
achieve high volume manufacturing goals.”
To learn more about the 3Di technology on the Dragonfly G3
system and the EchoScan void detection system, contact us or reach
out to your local sales team.
About Onto Innovation Inc.
Onto Innovation is a leader in process control, combining global
scale with an expanded portfolio of leading-edge technologies that
includes un-patterned wafer quality, 3D metrology spanning chip
features from nanometer scale transistors to large die
interconnects, macro defect inspection of wafers and packages,
metal interconnect composition, factory analytics, and lithography
for advanced semiconductor packaging.
Our breadth of offerings across the entire semiconductor value
chain combined with our connected thinking approach results in a
unique perspective to help solve our customers’ most difficult
yield, device performance, quality, and reliability issues. Onto
Innovation strives to optimize customers’ critical path of progress
by making them smarter, faster and more efficient. With
headquarters and manufacturing in the U.S., Onto Innovation
supports customers with a worldwide sales and service
organization.
Additional information can be found at
www.ontoinnovation.com.
Forward Looking Statements
This press release contains forward-looking statements within
the meaning of the Private Securities Litigation Reform Act of 1995
(the “Act”) which include statements relating to Onto Innovation’s
business momentum and future growth; the benefit to customers and
the capabilities of Onto Innovation’s products and customer
service; Onto Innovation’s ability to both deliver products and
services consistent with our customers’ demands and expectations
and strengthen its market position, Onto Innovation’s beliefs about
market opportunities as well as other matters that are not purely
historical data. Onto Innovation wishes to take advantage of the
“safe harbor” provided for by the Act and cautions that actual
results may differ materially from those projected as a result of
various factors, including risks and uncertainties, many of which
are beyond Onto Innovation’s control. Such factors include, but are
not limited to, the Company’s ability to leverage its resources to
improve its position in its core markets; its ability to weather
difficult economic environments; its ability to open new market
opportunities and target high-margin markets; the strength/weakness
of the back-end and/or front-end semiconductor market segments;
fluctuations in customer capital spending and any potential impact
as a result of the novel coronavirus situation; the Company’s
ability to effectively manage its supply chain and adequately
source components from suppliers to meet customer demand; its
ability to adequately protect its intellectual property rights and
maintain data security; its ability to effectively maneuver global
trade issues and changes in trade and export license policies; the
Company’s ability to maintain relationships with its customers and
manage appropriate levels of inventory to meet customer demands;
and the Company’s ability to successfully integrate acquired
businesses and technologies. Additional information and
considerations regarding the risks faced by Onto Innovation are
available in Onto Innovation’s Form 10-K report for the year ended
December 30, 2023, and other filings with the Securities and
Exchange Commission. As the forward-looking statements are based on
Onto Innovation’s current expectations, the Company cannot
guarantee any related future results, levels of activity,
performance or achievements. Onto Innovation does not assume any
obligation to update the forward-looking information contained in
this press release, except as required by law.
Source: Onto Innovation Inc.
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version on businesswire.com: https://www.businesswire.com/news/home/20250114327799/en/
Investor Relations: Sidney Ho, +1 408.376.9163
sidney.ho@ontoinnovation.com
Onto Innovation (NYSE:ONTO)
過去 株価チャート
から 12 2024 まで 1 2025
Onto Innovation (NYSE:ONTO)
過去 株価チャート
から 1 2024 まで 1 2025