Advantest and Wavecrest Co-Develop Jitter Analysis Tool for Test of Complex Internet IC Technology
2007年7月13日 - 11:06PM
PRニュース・ワイアー (英語)
... both members of Semiconductor Test Consortium, companies
partner to broaden applications for open architecture test SANTA
CLARA, Calif. and EDEN PRAIRIE, Minn., July 13
/PRNewswire-FirstCall/ -- Advantest Corporation
(TSE:6857TSE:NYSE:TSE:ATE), the world's leading supplier of
semiconductor test equipment, and Wavecrest Corporation, a leader
in designing and manufacturing cutting-edge test and measurement
solutions for analysis of signal integrity, jitter, and timing,
announce a new, jointly developed jitter analysis software tool
(JAT) for Advantest's multi-lane 6.5Gbps high-speed interface
SerDes test solution. The new software tool provides versatile,
high-volume, rapid analysis of the performance, reliability and
interoperability of high-speed serial transmitters, receivers and
interfaces for complex Internet infrastructure applications, such
as Fibre Channel, SONET, Gigabit Ethernet, PCI Express, SATA, and
FB DIMM The 6.5Gbps high-speed interface test module and the new
Jitter Analysis Tool run on Advantest's T2000 open architecture
test platform, providing a unique environment optimized for testing
SoC devices with high-frequency interfaces. The T2000 open
architecture test platform is based on OPENSTAR(R), the industry's
first totally public set of test architecture specifications,
managed by the Semiconductor Test Consortium. Advanced Jitter
Analysis Features The new Jitter Analysis Tool measurement
capabilities include deterministic jitter, random jitter, total
jitter, and eye width measurements on high-speed serial links.
Jitter measurements are used to pinpoint the data transmission
reliability in high-speed serial interfaces. A unique feature of
this solution is its ability to perform jitter measurements
relative to either a forwarded, embedded, or common clock
reference. This flexibility allows a single toolset to both
characterize and test a broad complement of high-speed interfaces
including PCI-Express Generation 2, XAUI revision 2 and
HyperTransport(TM) revision 3. In addition, the new
Advantest-Wavecrest solution can simultaneously measure jitter on
multiple lanes in parallel without the addition of complicated MUX
hardware and external instrumentation. This environment is ideal
for testing complicated networking and/or server devices which will
often include hundreds of high speed lanes. It leverages
Wavecrest's patented TailFit(TM) algorithm, providing Dual- Dirac
measurements, which are the mainstay of most high-speed SerDes
interface jitter specifications. The algorithms used in jitter
analysis tools are key to the accuracy and reliability of their
analysis. The approach used in this new tool has proven itself
unique in its ability to measure jitter on highly occluded
transmission eyes. Since many high-speed interfaces are specified
with 60% (or more) occlusion, this capability is necessary in order
to insure that no good devices are discarded as bad. Partnering to
Serve Customers Advantest and Wavecrest, both members of the
Semiconductor Test Consortium (STC) founded to foster collaboration
for the timely development of open semiconductor test solutions,
worked together to adapt a Wavecrest instrument tool from a
laboratory environment to an ATE environment. Adapting this bench
instrument tool offers a combination of speed and accuracy that has
not been available in the ATE industry. R. Keith Lee, President and
CEO of Advantest America, Inc., says, "More than ever before, our
customers need powerful, fast, accurate test solutions and it makes
perfect sense to partner with an excellent company such as
Wavecrest to be able to offer our customers an enhanced test
solutions suite. The Wavecrest jitter analysis tool complements our
test systems, handlers and software solutions and meets the high
engineering standards that have made Advantest the leader in the
ATE industry." Dennis J. Leisz, President and CEO of Wavecrest,
Corporation, says, "Since our inception in 1985 Wavecrest has
provided leading edge design and test products for the
semiconductor industry. This new partnership with Advantest will
build upon our two companies' strengths allowing us to introduce a
new generation of powerful test tools." Dr. Mike Li, CTO of
Wavecrest, says, "It's exciting to offer this unique capability to
the market and to bring the excellence of a lab tool to the
manufacturing floor. Our jointly adapted jitter analysis tool is
fast, accurate and reliable -- mirroring the capabilities of
Advantest's T2000 test platform -- and will benefit the industry by
ensuring higher performing, more reliable Internet connections."
About Advantest Advantest Corporation is the world's leading
supplier of automatic test equipment to the semiconductor industry.
Advantest's SoC, logic, memory, mixed-signal and RF testers and
device handlers are integrated into the most advanced semiconductor
fabrication lines in the world. Founded in Tokyo in 1954, Advantest
established its North American subsidiary in 1982 and its European
subsidiary in 1984. More information is available at
http://www.advantest.com/. About Wavecrest Wavecrest Corporation
was founded in 1985 to design and manufacture leading edge signal
analysis design and test instruments for high-speed complex
semiconductors and systems. Wavecrest products are found throughout
the world in semiconductor design labs and in IC production test
environments. More information is available at
http://www.wavecrest.com/. DATASOURCE: Advantest Corporation
CONTACT: Amy Gold of Advantest America, Inc., +1-212-850-6670, ; or
Dennis Petrich of Wavecrest Corporation, +1-952-646-0500, Web site:
http://www.advantest.com/ http://www.wavecrest.com/
Copyright