KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer quali... KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. 詳細を表示
期間 † | 前日比 | 前日比 % | 始値 | 高値 | 安値 | 平均出来高 | VWAP | |
---|---|---|---|---|---|---|---|---|
1 | -21.5421 | -3.31473018511 | 649.89 | 669.095 | 620.58 | 1258929 | 643.63976532 | CS |
4 | -4.0308 | -0.637402872677 | 632.3787 | 669.095 | 620.58 | 1141785 | 647.83588701 | CS |
12 | -179.6121 | -22.230320808 | 807.96 | 832.9987 | 609.4 | 1135189 | 674.50253919 | CS |
26 | -235.0221 | -27.221480941 | 863.37 | 894.77 | 609.4 | 1041253 | 726.59810502 | CS |
52 | 56.2979 | 9.84142994493 | 572.05 | 894.77 | 542.41 | 964346 | 702.42169751 | CS |
156 | 241.7879 | 62.5486082368 | 386.56 | 894.77 | 250.2 | 1182164 | 472.99509869 | CS |
260 | 451.5279 | 255.36019681 | 176.82 | 894.77 | 110.19 | 1210073 | 379.95380554 | CS |
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