
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer quali... KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. 詳細を表示
期間 † | 前日比 | 前日比 % | 始値 | 高値 | 安値 | 平均出来高 | VWAP | |
---|---|---|---|---|---|---|---|---|
1 | -8 | -0.93131548312 | 859 | 914.83 | 849.98 | 1554261 | 880.34431392 | CS |
4 | 103.25 | 13.8080909395 | 747.75 | 914.83 | 740.44 | 1280833 | 825.23877489 | CS |
12 | 165.63 | 24.1665086012 | 685.37 | 914.83 | 551.33 | 1313002 | 728.6712075 | CS |
26 | 235.76 | 38.3200052012 | 615.24 | 914.83 | 551.33 | 1186779 | 720.84699012 | CS |
52 | -12.37 | -1.43275768211 | 863.37 | 914.83 | 551.33 | 1111971 | 723.6153694 | CS |
156 | 531.51 | 166.362014461 | 319.49 | 914.83 | 250.2 | 1139601 | 538.48536379 | CS |
260 | 661.65 | 349.432268286 | 189.35 | 914.83 | 171.31 | 1173149 | 442.4789762 | CS |
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