ULVAC-PHI Launches Sales of Latest XPS System that Dramatically Accelerates Battery Research and Development
2022年7月5日 - 7:00PM
JCN Newswire
ULVAC-PHI Incorporated has launched the PHI GENESIS, an
automated and multi-function scanning X-ray photoelectron
spectrometer (XPS: X-ray Photoelectron Spectroscopy or ESCA:
Electron Spectroscopy for Chemical Analysis). The PHI GENESIS is
the united model of PHI's multi-functional scanning XPS instruments
and was designed for automation and simplified operation.
Background
Advanced materials such as all-solid-state batteries, advanced
semiconductors, and artificial photosynthesis are complex
combinations of materials, and their research and development
require speed in optimizing the performance of each material as
well as the combination of materials. There is a growing need for
high-performance and highly functional surface and interface
analysis that can dramatically accelerate such research and
development. ULVAC-PHI begins offering a new surface analysis
system that not only offers extremely high basic performance but
also a high degree of automation to meet the various individual
requirements of worldwide customers. The solution is the new "PHI
GENESIS" scanning X-ray photoelectron spectrometer (XPS) from
ULVAC-PHI.
Summary
The "PHI GENESIS" XPS is a new product that combines the core
"GENESIS" of the PHI surface analysis instruments, which has a
50-year tradition of advanced automation and reduced analysis time,
with expandability, and offers overwhelming basic performance in a
compact housing.
The "PHI GENESIS" XPS provides high-speed, high-sensitivity, and
overwhelming micro XPS analysis performance with automated
multi-sample analysis with automatic sample exchange. A
high-sensitivity analyzer with an improved counting rate also
contributes to high performance. To date, ULVAC-PHI and Physical
Electronics USA, a subsidiary of ULVAC-PHI, have developed various
world-first XPS analysis technologies including scanning micro XPS
and HAXPES (hard x-ray photoelectron spectroscopy), fully automated
robotics XPS analysis, full-automatic insulator neutralization
analysis, depth profiling of organic materials using cluster
etching ion gun. All of these technologies are incorporated into a
single instrument, making it possible to provide state-of-the-art
XPS analysis technology for all kinds of materials, including
metals, semiconductors, ceramics, and organic materials.
Another novel feature of PHI GENESIS is a new software package
designed for ease of use and designed for all levels of users, from
surface analysis beginners to well-trained scientists, from
manufacturing to cutting-edge research and development. We have
also prepared several options that allow customers to perform
advanced analyses that previously required sophisticated analytical
equipment such as a large synchrotron in a typical laboratory
environment.
PHI GENESIS is fully compatible with the analysis of today's most
advanced composite solid materials and composite solid devices and
aims to dominate the global market as an indispensable analytical
instrument for speeding up research and development.
About ULVAC-PHI, Incorporated
ULVAC-PHI, Incorporated was founded in 1982 and provides advanced
surface analysis instruments to universities and leading-edge
industries worldwide for research and development. The company
provides comprehensive surface analysis technology-based solutions
for materials and devices including metals, polymers,
semiconductors, batteries, organic and inorganic devices and
microelectronics. For more information, visit
https://www.ulvac-phi.com/en/.
X-ray photoelectron spectroscopy (XPS)
XPS (X-ray Photoelectron Spectroscopy) is one of the most popular
surface chemical analysis techniques that can provide chemical
information on the top few atomic layers of a solid surface. XPS
can provide qualitative and quantitative chemical information on
solid surfaces by evaluating the energy and intensity of
X-ray-induced electrons (photoelectrons). XPS is provided to
universities and industrial research facilities as well as for
quality control and quality assurance purposes, as it shows
excellent features for the analysis of surface and interface
phenomena such as coloration, adhesion, sliding, catalyst,
thin-film interfaces and electrical contacts.
For inquiries regarding this matter, please contact
Product Strategy Department, ULVAC-PHI Corporation
TEL: +81-467-85-4220 (Sales)
Related website
https://www.ulvac-phi.com
https://www.surf-analysis.com
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